Secure in Air высоко ценит профессиональное обслуживание, знания и советы Xenics при внедрении камеры Gobi в нашем проекте GeoCampro. Наш клиент был более чем удовлетворен результатами в проекте поиска (тепловых) дефектов в железнодорожном полотне.
Low-light-level imaging in semiconductor microscopy applications is used to detect faint emissions. This technique is also called photon emission microscopy or electroluminescence imaging. In general, electroluminescence is the emission of photons due to electrical stimulation.
Photon emission microscopy is typically done with SWIR cameras. In the SWIR band it is a proven technique for fault localization in microelectronic failure analysis.
Faults are localized by using several different techniques to isolate the defective areas on a die in the failed units. This is a very critical step in microelectronics as it dramatically reduces the area required for analysis. The localized defect is then characterized with a view to further understand the failure mechanism.
Photon emission can be caused by the following type of defects in the semiconductor material:
Photon emission from defects are generally associated with forward and reverse biased pn junctions, transistors in saturation or dielectric breakdown.
We have specially designed the Cougar-640 for this application. This highly sensitive SWIR camera has a high resolution of 640 x 512 pixels and a 20 μm pixel pitch. Because of its LN2 cooling and specially designed SFD ROIC, the Cougar-640 reaches a read noise of ~ 20 e- and a dark current of less than 20 e-/s. This allows the user to reach exposure times of several hours and makes the detection of the lowest light levels possible.